J

JE Barth

26 records found

Design of an aberration corrected low-voltage SEM

Electron optics of microlenses with inclined beams

Probe current, probe size, and the practical brightness for probe forming systems

Extracting the Boersch effect contribution from experimental energy spread measurements for Schottky electron emitters

Source brightness and useful beam current of carbon nanotubes and other very small emitters

Aberration integrals for the low-voltage foil corrector

Concept for a low energy foil corrector

Low-energy foil aberration corrector

Influence of the microchannel plate and anode gap parameters on the spatial resolution of an image intensifier.

Reduced brightness of the ZrO/W Schottky electron emitter.

Limits to the reduced brightness of the Zr/O/W Schottky emitter.

Beam brightness and STEM-EELS performance.
Conference paper (2000) - JE Barth (author)

Theory and measurements of the Zr/O/W Schottky emitter.

SEM resolution improvement at low voltage with gun monochromator.

Resolution improvement in Low Voltage SEM with FEG monochromator.

Dependence of the chromatic aberration spot size on the form of the energy distribution of the charged particles.
Journal article (1999) - JE Barth (author), MD Nijkerk (author)

Influence of Coulomb Interactions on current density distribution in a two-lens focused ion beam system

Feasibility study for a high brightness X-ray source of 1 micro-meter focal spot diameter

Extrapolation of the Coulomb interaction blur reduction due to spherical aberration to the axis

Stochastic coulomb interactions in ion projection lithography systems with aberration-broadened crossover