JR Kraayeveld | TU Delft Repository

JK

JR Kraayeveld

Conference paper (3)

Journal article (1)

4 records found

1

Resistance Changes Induced by the Formation of a Single Void/Hillock During Electromigration

Conference paper (1998) - A.H. Verbruggen (author), MJC van de Homberg (author), LC Jacobs (author), AJ Kalkman (author), JR Kraayeveld (author), S Radelaar (author)

Indications for band-structure effects in 2-dimensional lateral supperlattices

Journal article (1998) - KMH Lenssen (author), MEJ Boonman (author), JR Kraayeveld (author), CT Foxon (author)

Electromigration in short Al lines studied by high-resolution resistance measurement

Conference paper (1997) - A.H. Verbruggen (author), MJC van de Homberg (author), LC Jacobs (author), AJ Kalkman (author), JR Kraayeveld (author), S Radelaar (author)

Current dependence of reversible electromigration induced resistance changes in short Al lines and interpretation of irreversible effects

Conference paper (1996) - A.H. Verbruggen (author), MJC van de Homberg (author), AJ Kalkman (author), JR Kraayeveld (author), AWJ Willemsen (author), S Radelaar (author)