MJC van de Homberg | TU Delft Repository

Mv

MJC van de Homberg

Conference paper (7)

Doctoral thesis (1)

Journal article (3)

11 records found

1

l/f noise in mono- and polycrystalline aluminium

Journal article (1998) - MJC van de Homberg (author), A.H. Verbruggen (author), P.F.A. Alkemade (author), S Radelaar (author), E Ochs (author), K Armbruster-Dagge (author), A Seeger (author), H Stoll (author)

Resistance Changes Induced by the Formation of a Single Void/Hillock During Electromigration

Conference paper (1998) - A.H. Verbruggen (author), MJC van de Homberg (author), LC Jacobs (author), AJ Kalkman (author), JR Kraayeveld (author), S Radelaar (author)

Microstructural and electrical properties of resolidified submicron Al lines.

Doctoral thesis (1998) - MJC van de Homberg (author)

Electromigration and l/f noise in single-crystalline, bamboo and polycrystalline Al lines

Conference paper (1998) - MJC van de Homberg (author), P.F.A. Alkemade (author), A.H. Verbruggen (author), AG Dirks (author), E Ochs (author), S Radelaar (author)

Fabricaton of submicron single-crystalline and bamboo Al lines by recrystallization

Journal article (1997) - MJC van de Homberg (author), A.H. Verbruggen (author), P.F.A. Alkemade (author), AG Dirks (author), JL Hurd (author), S Radelaar (author)

Curved crystal lattice in resolidified submicron Al lines

Journal article (1997) - MJC van de Homberg (author), P.F.A. Alkemade (author), S Radelaar (author), JL Hurd (author), AG Dirks (author)

Electromigration and 1/f noise in single-crystalline, bamboo and polycrystalline Al lines

Conference paper (1997) - MJC van de Homberg (author), P.F.A. Alkemade (author), A.H. Verbruggen (author), AG Dirks (author), E Ochs (author), S Radelaar (author)

1/f noise and microsructure in thin aluminium lines

Conference paper (1997) - E Ochs (author), MJC van de Homberg (author), P.F.A. Alkemade (author), K Armbruster (author), A Seeger (author), H Stoll (author), A.H. Verbruggen (author)

Electromigration in short Al lines studied by high-resolution resistance measurement

Conference paper (1997) - A.H. Verbruggen (author), MJC van de Homberg (author), LC Jacobs (author), AJ Kalkman (author), JR Kraayeveld (author), S Radelaar (author)

Single-crystalline and bamboo Al lines fabricated by graphoepitaxy

Conference paper (1996) - MJC van de Homberg (author), A.H. Verbruggen (author), P.F.A. Alkemade (author), S Radelaar (author)

Current dependence of reversible electromigration induced resistance changes in short Al lines and interpretation of irreversible effects

Conference paper (1996) - A.H. Verbruggen (author), MJC van de Homberg (author), AJ Kalkman (author), JR Kraayeveld (author), AWJ Willemsen (author), S Radelaar (author)