In many countries digital maps are generally created and provided by Cadastre, Land Registry or National Mapping Agencies. These maps must be accurate and well maintained. However, in most cases, the update process of these maps is still done by hand, often using satellite or aerial imagery. Supporting this process via automatic change detection based on traditional classification algorithms is difficult due to the high level of noise in the data, such as introduced by temporary changes (e.g. cars being parked). This paper describes a method to detect changes between two time steps using 2.5D data and to transfer these insights to a digital map. For every polygon in the map, several attributes are collected from the input data, which are used to train a machine-learning model based on gradient boosting. A case study in Haarlem, in the Netherlands, was conducted to test the performance of this proposed approach. Results show that this methodology can recognize a substantial amount of changes and can support - and speed up - the manual updating process.

@en

A quick-scan yield prediction method has been developed to assess rooftop photovoltaic (PV) potential. The method has three main parts. For each roof, first (i) virtual 3D roof segments were reconstructed using aerial imagery, then, (ii) PV modules were automatically fitted onto roof segments using a fitting algorithm and finally, (iii) expected annual yield was calculated. For each roof, the annual yield was calculated by three different quick yield calculation approaches. Two approaches are commercial software packages of Solar Monkey (SM) and Photovoltaic Geographical Information System (PVGIS) whereas the other one is the simplified skyline-based approach developed in photovoltaic material and devices (PVMD) group of Delft University of Technology. To validate the quick-scan method, a set of 145 roofs and 215 roof segments were chosen in urban areas in the Netherlands. For the chosen roofs, the number of fitted modules and calculated yield were compared with the actual modular layout and the measured yield of existing PV systems. Results showed a satisfactory agreement between the quick-scan yield prediction and measured annual yield per roof, with relative standard deviations of 7.2%, 9.1%, and 7.5% respectively for SM, PVGIS, and PVMD approaches. It was concluded that the obstacle-including approaches (e.g. SM and PVMD) outperformed the approaches which neglect the shading by surrounding obstacles (e.g. PVGIS). Results also showed that 3D roof segments had added value as input for the quick-scan PV yield prediction methods since the precision of yield prediction was significantly lower using only 2D land register data of buildings.@en