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D.B. Boltje

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Patent (2)

2 records found

1

Method for localizing a region of interest in a sample and micromachining the sample using a charged particle beam

Patent (2024) - E.B. van der Wee (inventor), D.B. Boltje (inventor), D.B. Boltje (inventor), Jacob P. Hoogenboom (inventor), J.P. Hoogenboom (inventor)

Method and apparatus for in-situ sample quality inspection in cryogenic focused ion beam milling

Patent (2024) - R. Skoupý (inventor), A. Jakobi (inventor), D.B. Boltje (inventor), D.B. Boltje (inventor), Jacob P. Hoogenboom (inventor), J.P. Hoogenboom (inventor)