EM Franken | TU Delft Repository

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EM Franken

Journal article (3)

3 records found

1

Quantifying resolution limiting factors in subtomogram averaged cryo-electron tomography using simulations

Journal article (2014) - L.M. Voortman (author), M. Vulovic (author), M Maletta (author), A Voigt (author), EM Franken (author), A Simonetti (author), PJ Peters (author), L. J. Van Vliet (author), Lucas van Vliet (author), Lucas J. Van Vliet (author), L. J. van Vliet (author), L.J. Van Vliet (author), Lucas Van Vliet (author), L.J. van Vliet (author), Lucas J. van Vliet (author), B. Rieger (author), Bernd Rieger (author)

Precise and unbiased estimation of astigmatism and defocus in transmission electron microscopy

Journal article (2012) - M. Vulovic (author), EM Franken (author), RBG Ravelli (author), Lucas Van Vliet (author), L. J. van Vliet (author), Lucas van Vliet (author), Lucas J. van Vliet (author), L.J. van Vliet (author), Lucas J. Van Vliet (author), L.J. Van Vliet (author), L. J. Van Vliet (author), Bernd Rieger (author), B. Rieger (author)

Fast, spatially varying CTF correction in TEM

Journal article (2012) - L.M. Voortman (author), EM Franken (author), Lucas Van Vliet (author), L.J. Van Vliet (author), Lucas van Vliet (author), L.J. van Vliet (author), Lucas J. van Vliet (author), L. J. van Vliet (author), Lucas J. Van Vliet (author), L. J. Van Vliet (author), Bernd Rieger (author), B. Rieger (author)