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MH
M Huefner
Academic Work (2)
Journal article (2)
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2 records found
1
Integration of a fabrication process for an aluminum single-electron transistor and a scanning force probe for tuning-fork-based probe microscopy
Journal article (2010) -
K Suter (author)
,
T Akiyama (author)
,
NF de Rooij (author)
,
M Huefner (author)
,
U. Staufer (author)
Scanning gate microscopy measurements on a superconducting single-electron transistor
Journal article (2009) -
M Huefner (author)
,
M Hilke (author)
,
U. Staufer (author)
