Enthalpy-entropy compensation (EEC) is very often encountered in chemistry, biology and physics. Its origin is widely discussed since it would allow, for example, a very accurate tuning of the thermodynamic properties as a function of the reactants. However, EEC is often discarded as a statistical artefact, especially when only a limited temperature range is considered. We show that the likeliness of a statistical origin of an EEC can be established with a compensation quality factor (CQF) that depends only on the measured enthalpies and entropies and the experimental temperature range. This is directly derived from a comparison of the CQF with threshold values obtained from a large number of simulations with randomly generated Van ‘t Hoff plots. The value of CQF is furthermore a direct measure of the existence of a genuine isoequilibrium or isokinetic relationship.

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MgHx thin films are grown by activated reactive evaporation in a Molecular Beam Epitaxy system fitted with an atomic hydrogen source. During deposition the electrical and optical properties are measured in-situ. The structural properties are determined ex-situ by Atomic Force Microscopy. These measurements confirm the growth of the MgH2 phase, however the presence of 10 vol.% of metallic Mg cannot be prevented. The metallic Mg grains cause an optical absorption edge at 2.0 eV, which has a completely different origin than the observed band gap of MgH2 at 5.6 eV. The observed optical spectra can be modelled using an effective medium theory. The Mg hydride films are electrically insulating despite the presence of metallic Mg particles. Upon re-hydrogenation of a de-hydrogenated in-situ grown MgHx thin film, the absorption edge at 2.0 eV disappears and the resistivity decreases to values normally observed for ex-situ hydrogenated films.@en

Using hydrogenography, we recently mapped the thermodynamic properties of a large range of compositions in the quaternary Mg-Ti-Ni-H system. The enthalpy of hydride formation of Mg-Ni alloys is significantly altered upon Ti doping. For a small range of compositions, we find a hydrogenation enthalpy ΔH=-40 kJ (mol H2) -1, which is the desired enthalpy for hydrogen storage at moderate temperature and pressure. This enthalpy value is surprising since it is significantly less negative than the ΔH of the Mg-Ni and Mg-Ti hydrides. The nanostructure of the Mg-Ti-Ni-H films hinders a direct determination of the hydride phases involved by x-ray diffraction. Using density functional theory calculations for various hydrogenation reaction paths, we establish that the destabilization of the Mg-Ni-H system by Ti doping is due to the formation of Mg2 Ni and Ti-Ni intermetallics in the as-deposited state, which transform into a metastable Ti-doped Mg2 Ni H4 phase upon hydrogenation. The Ti-doped Mg2 Ni H4 phase can be considered as a heavily doped semiconductor.@en

The search for new lightweight metal hydride storage materials is essentially like looking for a needle in a haystack. Over the years, a number of combinatorial methods have been developed to scan the properties of materials in an efficient way. We demonstrate that combinatorial techniques are also applicable for the search of suitable hydrogen storage materials. This applies especially to hydrogenography, a novel optical screening method that measures simultaneously the enthalpy of hydride formation of thousands of materials on a single thin film wafer.

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Hydrogenography is an advanced combinatorial and standard method used for the search of new hydrogen-storage materials to synthesize bulk samples and to use volumetric or gravimetric techniques to follow their hydrogenation reaction. Hydrogenography, with a straightforward optical setup, makes it possible to monitor hydrogen absorption and desorption simultaneously on thousands of samples under exactly the same experimental conditions. Hydrogenography is much more than a monitoring technique, as it also provides a high-throughput method to measure quantitatively the key thermodynamic properties of hydride formation. The continuous change of optical transmission with hydrogen concentration was used to measure the pressure-concentration isotherms and determine the enthalpy of hydride formation. Hydrogenography is valuable for the search for catalytic caplayers promoting hydrogen uptake, electrode materials for batteries, and smart coatings for adaptive solar collectors.

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Mg₂NiH₄ thin films have been prepared by activated reactive evaporation in a molecular beam epitaxy system equipped with an atomic hydrogen source. The optical reflection spectra and the resistivity of the films are measured in situ during deposition. In situ grown Mg₂NiH ₄ appears to be stable in vacuum due to the fact that the dehydrogenation of the Mg₂NiH₄ phase is kinetically blocked. Hydrogen desorption only takes place when a Pd cap layer is added. The optical band gap of the in situ deposited Mg₂NiH₄ hydride, 1.75 eV, is in good agreement with that of Mg₂NiH₄ which has been formed ex situ by hydrogenation of metallic Pd capped Mg₂Ni films. The microstructure of these in situ grown films is characterized by a homogeneous layer with very small grain sizes. This microstructure suppresses the preferred hydride nucleation at the film/substrate interface which was found in as-grown Mg₂Ni thin films that are hydrogenated after deposition.

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