AS
AF Seibert
15 records found
1
Thin films of uranium cerium mixed oxides UxCe1−xO2±y have been prepared by DC sputtering and characterized by X-ray photoelectron spectroscopy (XPS). Reduction and oxidation properties were analysed by exposing the films to atomic hydrogen and to
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Solid/liquid equilibria in the system UO2–ZrO2 are revisited in this work by laser heating coupled with fast optical thermometry. Phase transition points newly measured under inert gas are in fair agreement with the early measurements performed by Wisnyi et
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