E Oliviero | TU Delft Repository

EO

E Oliviero

Journal article (3)

Report (1)

4 records found

1

Helium implantation defects in SiC: a thermal helium desorption spectrometry investigation

Journal article (2003) - E Oliviero (author), MF Beaufort (author), JF Barbot (author), A van Veen (author), AV Fedorov (author)

Helium implantation in silicon: the effects of implantation temperature

Journal article (2003) - E Oliviero (author), ML David (author), AV Fedorov (author), A van Veen (author), MF Beaufort (author), JF Barbot (author)

On the effects of implantation temperature in helium implanted silicon

Journal article (2002) - E Oliviero (author), ML David (author), MF Beaufort (author), JF Barbot (author), A van Veen (author)

Characterisation of defects in industrial silicon carbide (6H-SiC) by helium desorption techniques

Report (2001) - E Oliviero (author), KT Westerduin (author), A van Veen (author)