In this work we report on recent advances in the fabrication and characterization of crossed InSb nanowires. The yield of crystalline nanowire crosses has been increased by growing the wires on 111 facets created in 100-oriented InP substrates by wet chemical etching. Ebeam lithography on the tilted facets has been developed to precisely control the position of the catalysts particles, crucial for an optimized crossing process. With transmission electron microscopy we investigate the crystalline quality of the wire-wire interface. Low-temperature transport studies show quantized conductance across the junction indicating the high quality of the merged nanowires.