A Beyer | TU Delft Repository

AB

A Beyer

Journal article (2)

2 records found

1

Focused electron beam induced processing and the effect of substrate thickness revisited

Journal article (2013) - W.F. van Dorp (author), A Beyer (author), M Mainka (author), A Gölzhäuser (author), TW Hansen (author), JB Wagner (author), C. W. Hagen (author), C.W. Hagen (author), JTM de Hosson (author)

Ultrahigh resolution focused electron beam induces processing: the effect of substrate thickness

Journal article (2011) - W.F. van Dorp (author), I. Lazic (author), A Beyer (author), A Golzhauser (author), JB Wagner (author), TW Hansen (author), C. W. Hagen (author), C.W. Hagen (author)