Analysis and calibration of process variations for an array of temperature sensors

Conference paper (2017)

Authors

S. Xie Electronic Instrumentation -

A.N. Abarca Prouza Electronic Instrumentation -

J. Markenhof External organisation

X. Ge Electronic Instrumentation -

A.J.P.A.M. Theuwissen Electronic Instrumentation -

Research Group

Electronic Instrumentation () (TU Delft)

Calibration CMOS image sensor Sensor array BJT based temperature sensor

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http://resolver.tudelft.nl/uuid:dab136bf-867c-4608-86d0-3be7cef61e17

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Published Date

2017

Language

English

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Faculty

Electrical Engineering, Mathematics and Computer Science

Department

Microelectronics

Research Group

Electronic Instrumentation

Abstract

This paper presents an analysis and calibration of process variations for an array of temperature sensors, which are incorporated into a CMOS image sensor chip. Making use of the experimental results of more than 500 temperature sensors implemented on the same chip, the proposed calibration method has removed their process variations from 14.3 % to 2.5 % (3 sigma).

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