High speed wavefront sensorless aberration correction in digital micromirror based confocal microscopy

Journal article (2017)

Authors

P. Pozzi Team Raf Van de Plas - Mechanical, Maritime and Materials Engineering
D. Wilding Team Raf Van de Plas - Mechanical, Maritime and Materials Engineering
O.A. Soloviev Flexible Optical B.V., EKL-Users - EEMCS , ITMO University, Team Raf Van de Plas - Mechanical, Maritime and Materials Engineering
H.R.G.W. Verstraete Team Raf Van de Plas - Mechanical, Maritime and Materials Engineering
L. Bliek Team Raf Van de Plas - Mechanical, Maritime and Materials Engineering
Gleb Vdovin Team Raf Van de Plas - Mechanical, Maritime and Materials Engineering , ITMO University, Flexible Optical B.V.
M.H.G. Verhaegen Team Raf Van de Plas - Mechanical, Maritime and Materials Engineering
Research Group
Team Raf Van de Plas (Mechanical, Maritime and Materials Engineering) (TU Delft)
More Info
expand_more

Published Date

2017

Language

English

Reuse Rights

Other than for strictly personal use, it is not permitted to download, forward or distribute the text or part of it, without the consent of the author(s) and/or copyright holder(s), unless the work is under an open content license such as Creative Commons.

Faculty

Mechanical, Maritime and Materials Engineering

Department

Delft Center for Systems and Control

Research Group

Team Raf Van de Plas

Abstract

The quality of fluorescence microscopy images is often impaired by the presence
of sample induced optical aberrations. Adaptive optical elements such as deformable mirrors or spatial light modulators can be used to correct aberrations. However, previously reported techniques either require special sample preparation, or time consuming optimization procedures for the correction of static aberrations. This paper reports a technique for optical sectioning fluorescence microscopy capable of correcting dynamic aberrations in any fluorescent sample during the acquisition. This is achieved by implementing adaptive optics in a non conventional confocal microscopy setup, with multiple programmable confocal apertures, in which out of focus light can be separately detected, and used to optimize the correction performance with a sampling frequency an order of magnitude faster than the imaging rate of the system. The
paper reports results comparing the correction performances to traditional image optimization algorithms, and demonstrates how the system can compensate for dynamic changes in the aberrations, such as those introduced during a focal stack acquisition though a thick sample.

Files

Oe_25_2_949.pdf
(pdf | 2.76 Mb)
Unknown license

Download not available