Process variation aware modeling of interconnect capacitance

Conference paper (2008)

Authors

Y. Bi Old - EWI Sect. Circuits and Systems
D. Ioan External organisation
N.P. van der Meijs Signal Processing Systems - EEMCS
Research Group
Old - EWI Sect. Circuits and Systems
More Info
expand_more

Published Date

2008

Language

Undefined/Unknown

Reuse Rights

Other than for strictly personal use, it is not permitted to download, forward or distribute the text or part of it, without the consent of the author(s) and/or copyright holder(s), unless the work is under an open content license such as Creative Commons.

Research Group

Old - EWI Sect. Circuits and Systems