In situ imaging of electromigration-induced nanogap formation by transmission electron microscopy

Journal article (2007)

Authors

HB Heersche QN/Mol. Electronics & Devices
G Lientschnig External organisation
K.M. O'Neill QN/Mol. Electronics & Devices
H.S.J. van der Zant QN/Mol. Electronics & Devices
Research Group
QN/Mol. Electronics & Devices
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Published Date

2007

Language

Undefined/Unknown

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Research Group

QN/Mol. Electronics & Devices