Thickness-Dependent Refractive Index of 1L, 2L, and 3L MoS 2 , MoSe 2 , WS 2 , and WSe 2

Journal article (2019)

Authors

C. Hsu Kavli institute of nanoscience Delft, Instituto de Ciencia de Materiales de Madrid (ICMM), QN/van der Zant Lab - AS
Riccardo Frisenda Instituto de Ciencia de Materiales de Madrid (ICMM)
Robert Schmidt University of Münster
Ashish Arora University of Münster
Steffen Michaelis de Vasconcellos University of Münster
Rudolf Bratschitsch University of Münster
H.S.J. van der Zant QN/van der Zant Lab - AS , Kavli institute of nanoscience Delft
Andres Castellanos-Gomez Instituto de Ciencia de Materiales de Madrid (ICMM)
Research Group
QN/van der Zant Lab (AS) (TU Delft)
Copyright: © 2019 C. Hsu, Riccardo Frisenda, Robert Schmidt, Ashish Arora, Steffen Michaelis de Vasconcellos, Rudolf Bratschitsch, H.S.J. van der Zant, Andres Castellanos-Gomez
DOI: https://doi.org/10.1002/adom.201900239
More Info
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Published Date

2019

Language

English

Faculty

Applied Sciences

Department

QN/Quantum Nanoscience

Research Group

QN/van der Zant Lab

Abstract


An interesting aspect of 2D materials is the change of their electronic structure with the reduction of thickness. Molybdenum and tungsten-based transition metal dichalcogenides form an important family of 2D materials, whose members show a thickness-dependent bandgap and strong light–matter interaction. In this work, the experimental determination of the complex refractive index of 1-, 2-, 3-layer thick MoS
2
, MoSe
2
, WS
2
, and WSe
2
in the range from 400 to 850 nm of the electromagnetic spectrum is reported by using microreflectance spectroscopy and combined with calculations based on the Fresnel equations. It is further provided a comparison with the bulk refractive index values reported in the literature and a discussion of the difference/similarity between our work and the monolayer refractive index available from the literature, finding that the results from different techniques are in good agreement.