A non-unit line protection method for MMC-HVDC grids based on the curvatures of backward traveling waves

Journal article (2023)

Authors

F. Xie Intelligent Electrical Power Grids - EEMCS , Xi’an Jiaotong University
Zhiguo Hao Xi’an Jiaotong University
Dongmeng Ye Xi’an Jiaotong University
Songhao Yang Xi’an Jiaotong University
Chuanxi Li XJ Electric
Guoan Dai XJ Electric
Baohui Zhang Xi’an Jiaotong University
Ting Wang School of Electrical and Electronic Engineering
Research Group
Intelligent Electrical Power Grids (EEMCS) (TU Delft)
Copyright: © 2023 F. Xie, Zhiguo Hao, Dongmeng Ye, Songhao Yang, Chuanxi Li, Guoan Dai, Baohui Zhang, Ting Wang
DOI: https://doi.org/10.1016/j.ijepes.2023.109373
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Published Date

2023

Language

English

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Faculty

Electrical Engineering, Mathematics and Computer Science

Department

Electrical Sustainable Energy

Research Group

Intelligent Electrical Power Grids

Abstract

The existing protection techniques for high-voltage direct-current (HVDC) grids suffer from several shortcomings such as high sampling frequency, poor robustness, and reliance on simulation for threshold setting. To solve these problems, this paper proposes a non-unit protection method for modular multilevel converter (MMC)-based HVDC grids using the curvatures of backward traveling waves. To this end, the propagation characteristics of traveling waves and the boundary characteristics of DC lines are first studied, then the analytical expressions of backward traveling waves are derived. Moreover, the curvatures of backward traveling waves are analyzed. On this basis, a non-unit protection method is proposed, including zone selection, disturbance identification, and pole selection. At last, with a protection platform and a real-time digital simulator (RTDS) platform of the MMC-HVDC grid, the accuracy and the robustness of the proposed protection method are verified. The results show that the protection method can correctly identify faults with different distances and resistance in 1 ms and has strong robustness against transition resistance, sampling frequency, boundary value, noise, system topology, and line parameters.

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