A modified and calibrated drift-diffusion-reaction model for time-domain analysis of charging phenomena in electron-beam irradiated insulators

Abstract

This paper presents a modified self-consistent drift-diffusion-reaction
model suitable for the analysis of electron-beam irradiated insulators
at both short and long time scales. A novel boundary condition is
employed that takes into account the reverse electron current and a
fully dynamic trap-assisted generation-recombination mechanism is
implemented. Sensitivity of the model with respect to material
parameters is investigated and a calibration procedure is developed that
reproduces experimental yield-energy curves for uncharged insulators.
Long-time charging and yield variations are analyzed for stationary
defocused and focused beams as well as moving beams dynamically scanning
composite insulators.