Localization microscopy at doubled precision with patterned illumination

Journal article (2020)

Authors

J.P. Cnossen ImPhys/Quantitative Imaging , Team Raf Van de Plas - Mechanical, Maritime and Materials Engineering

T.A. Hinsdale ImPhys/Quantitative Imaging

R.Ø. Thorsen ImPhys/Quantitative Imaging

Florian Schueder Max Planck Institute of Biochemistry, Ludwig Maximilians University

Ralf Jungmann Max Planck Institute of Biochemistry, Ludwig Maximilians University

C.S. Smith University of Oxford, Team Raf Van de Plas - Mechanical, Maritime and Materials Engineering , ImPhys/Quantitative Imaging

Bernd Rieger ImPhys/Quantitative Imaging

B. Rieger ImPhys/Quantitative Imaging

S. Stallinga ImPhys/Imaging Physics

Sjoerd Stallinga ImPhys/Imaging Physics

Research Group

Team Raf Van de Plas (Mechanical, Maritime and Materials Engineering) (TU Delft)

DOI: https://doi.org/10.1038/s41592-019-0657-7

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Published Date

2020

Language

English

Reuse Rights

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Faculty

Mechanical, Maritime and Materials Engineering

Department

Delft Center for Systems and Control

Research Group

Team Raf Van de Plas

Abstract

MINFLUX offers a breakthrough in single molecule localization precision, but is limited in field of view. Here we combine centroid estimation and illumination pattern induced photon count variations in a conventional widefield imaging setup to extract position information over a typical micrometer-sized field of view. We show a near two-fold improvement in precision over standard localization with the same photon count on DNA-origami nanostructures and tubulin in cells, using DNA-PAINT and STORM imaging.

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