On using asymmetry information for classification in extended dissimilarity spaces

Journal article (2012)

Authors

Y. Plasencia Calana Pattern Recognition and Bioinformatics - EEMCS
E García-Reyes External organisation
R.P.W. Duin Pattern Recognition and Bioinformatics - EEMCS
Bob Duin Pattern Recognition and Bioinformatics - EEMCS
M Orozco-Alzate External organisation
Research Group
Pattern Recognition and Bioinformatics (EEMCS) (TU Delft)
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Published Date

2012

Language

English

Reuse Rights

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Faculty

Electrical Engineering, Mathematics and Computer Science

Department

Intelligent Systems

Research Group

Pattern Recognition and Bioinformatics