Analysis of SESANS data by numerical Hankel transform implementation in SasView

Journal article (2020)

Authors

J.H. Bakker RST/Neutron and Positron Methods in Materials - AS , RST/Radiation, Science and Technology
Adam Washington Rutherford Appleton Laboratory
S.R. Parnell RID/TS/Instrumenten groep , RST/Radiation, Science and Technology
A.A. van Well RID/Algemeen/Bedrijfsondersteuning , RST/Radiation, Science and Technology
C. Pappas RST/Radiation, Science and Technology , RST/Neutron and Positron Methods in Materials - AS
W.G. Bouwman RST/Radiation, Science and Technology , RST/Neutron and Positron Methods in Materials - AS
Research Group
RST/Neutron and Positron Methods in Materials (AS) (TU Delft)
Copyright: © 2020 J.H. Bakker, Adam L. Washington, S.R. Parnell, A.A. van Well, C. Pappas, W.G. Bouwman
DOI: https://doi.org/10.3233/jnr-200154
More Info
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Published Date

2020

Language

English

Faculty

Applied Sciences

Department

RST/Radiation, Science and Technology

Research Group

RST/Neutron and Positron Methods in Materials

Abstract

SESANS data analysis has been implemented in the SasView software package, allowing SESANS experiments to be analyzed using a numerical Hankel transformation of isotropic small-angle scattering (SAS) models. The error of the numerical approximation is three orders of magnitude below typical experimental errors. All advanced data fitting features of SasView (multi-model fitting, batch fitting, and simultaneous/constrained fitting) are now also available for SESANS and this is demonstrated by examples of fitting SAS models to SESANS measurements.