Thermal transient effect and improved junction temperature measurement method in high-voltage light-emitting diodes

Journal article (2013)

Authors

H. Ye Electronic Components, Technology and Materials -

X Chen External organisation

H.W. van Zeijl Electronic Components, Technology and Materials -

AWJ Gielen External organisation

Kouchi Zhang Electronic Components, Technology and Materials -

Guoqi Zhang Electronic Components, Technology and Materials -

Research Group

Electronic Components, Technology and Materials () (TU Delft)

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http://resolver.tudelft.nl/uuid:570ecb5e-70fa-4dea-9535-4fb922edccc4

More Info

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Published Date

2013

Language

English

Reuse Rights

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Faculty

Electrical Engineering, Mathematics and Computer Science

Department

Microelectronics

Research Group

Electronic Components, Technology and Materials