The use of neural network tools in statistical pattern recognition

Conference paper (1997)

Authors

R.P.W. Duin ImPhys/Quantitative Imaging
Bob Duin ImPhys/Quantitative Imaging
EEE Frietman ImPhys/Quantitative Imaging
A Hoekstra ImPhys/Quantitative Imaging
R. Ligteringen ImPhys/Quantitative Imaging
D. de Ridder ImPhys/Quantitative Imaging
M Skurichina ImPhys/Quantitative Imaging
D.M.J. Tax ImPhys/Quantitative Imaging
David M. J. Tax ImPhys/Quantitative Imaging
David Tax ImPhys/Quantitative Imaging
David M.J. Tax ImPhys/Quantitative Imaging
A Ypma ImPhys/Quantitative Imaging
Research Group
ImPhys/Quantitative Imaging
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Published Date

1997

Language

Undefined/Unknown

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Research Group

ImPhys/Quantitative Imaging