A study on the robustness of Pseudo Random Binary Array based surface characterization

Conference paper (1998)

Authors

HJW Spoelder External organisation
Frans Vos ImPhys/Quantitative Imaging
F.M. Vos ImPhys/Quantitative Imaging
Frans M. Vos ImPhys/Quantitative Imaging
F. M. Vos ImPhys/Quantitative Imaging
EM Petriu External organisation
FCA Groen External organisation
Research Group
ImPhys/Quantitative Imaging
More Info
expand_more

Published Date

1998

Language

Undefined/Unknown

Reuse Rights

Other than for strictly personal use, it is not permitted to download, forward or distribute the text or part of it, without the consent of the author(s) and/or copyright holder(s), unless the work is under an open content license such as Creative Commons.

Research Group

ImPhys/Quantitative Imaging