Sensitivity modeling on on-chip interconnect capacitances parasitics extraction for manufacturing variability

Doctoral thesis (2012)

Authors

Y. Bi Signal Processing Systems - EEMCS
Research Group
Signal Processing Systems (EEMCS) (TU Delft)
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Published Date

2012

Language

English

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Faculty

Electrical Engineering, Mathematics and Computer Science

Department

Microelectronics

Research Group

Signal Processing Systems