Towards spark-proof gaseous pixel detectors

Journal article (2016)

Authors

S. Tsigaridas National Institute of Subatomic Physics

M. V. Beuzekom National Institute of Subatomic Physics

H.W. Chan Electronic Components, Technology and Materials - , National Institute of Subatomic Physics

H. van der Graaf National Institute of Subatomic Physics, RST/Neutron and Positron Methods in Materials -

F. Hartjes National Institute of Subatomic Physics

K. Heijhoff National Institute of Subatomic Physics

N. P. Hessey National Institute of Subatomic Physics

V. Prodanovic EKL-Users - , National Institute of Subatomic Physics

Research Group

Electronic Components, Technology and Materials () (TU Delft)

CMOS readout of gaseous detectors Detector design and construction technologies and materials Gaseous imaging and tracking detectors Micropattern gaseous detectors (MSGC, GEM, THGEM, RETHGEM, MHSP, MICROPIC, MICROMEGAS, InGrid, etc)

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Published Date

15-11-2016

Language

English

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Faculty

Electrical Engineering, Mathematics and Computer Science

Department

Microelectronics

Research Group

Electronic Components, Technology and Materials

Abstract

The micro-pattern gaseous pixel detector, is a promising technology for imaging and particle tracking applications. It is a combination of a gas layer acting as detection medium and a CMOS pixelated readout-chip. As a prevention against discharges we deposit a protection layer on the chip and then integrate on top a micromegas-like amplification structure. With this technology we are able to reconstruct 3D track segments of particles passing through the gas thanks to the functionality of the chip. We have turned a Timepix3 chip into a gaseous pixel detector and tested it at the SPS at Cern. The preliminary results are promising and within the expectations. However, the spark protection layer needs further improvement to make reliable detectors. For this reason, we have created a setup for spark-testing. We present the first results obtained from the lab-measurements along with preliminary results from the testbeam.