Model based wavefront sensorless adaptive optics in confocal microscopy with reflective pinhole

Conference paper (2017)

Authors

P. Pozzi Team Raf Van de Plas - Mechanical, Maritime and Materials Engineering
O.A. Soloviev ITMO University, Team Raf Van de Plas - Mechanical, Maritime and Materials Engineering , Flexible Optical B.V.
D. Wilding Team Raf Van de Plas - Mechanical, Maritime and Materials Engineering
Gleb Vdovin Flexible Optical B.V., Team Raf Van de Plas - Mechanical, Maritime and Materials Engineering , ITMO University
M.H.G. Verhaegen Team Raf Van de Plas - Mechanical, Maritime and Materials Engineering
Research Group
Team Raf Van de Plas (Mechanical, Maritime and Materials Engineering) (TU Delft)
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Published Date

2017

Language

English

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Faculty

Mechanical, Maritime and Materials Engineering

Department

Delft Center for Systems and Control

Research Group

Team Raf Van de Plas

Abstract

We present a new method for fast wavefront sensorless correction of phase aberrations in confocal microscopy, based on a physical model of the distribution of fluorescence light rejected by the pinhole. The method is described, and an experimental confirmation of the method is provided.

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