A new sharpness measure based on Gaussian lines and edges

Journal article (2003)

Authors

J Dijk ImPhys/Quantitative Imaging
M van Ginkel ImPhys/Quantitative Imaging
RJ van Asselt External organisation
Lucas Van Vliet ImPhys/Quantitative Imaging
L.J. Van Vliet ImPhys/Quantitative Imaging
Lucas J. van Vliet ImPhys/Quantitative Imaging
L. J. van Vliet ImPhys/Quantitative Imaging
L.J. van Vliet ImPhys/Quantitative Imaging
Lucas J. Van Vliet ImPhys/Quantitative Imaging
Lucas van Vliet ImPhys/Quantitative Imaging
L. J. Van Vliet ImPhys/Quantitative Imaging
P.W. Verbeek ImPhys/Quantitative Imaging
Research Group
ImPhys/Quantitative Imaging
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Published Date

2003

Language

Undefined/Unknown

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Research Group

ImPhys/Quantitative Imaging