Hydrogen storage in Mg2FeSi alloy thin films depending on the Fe-to-Si ratio measured by conversion electron Mössbauer spectroscopy

Journal article (2018)

Authors

T.T. Trinh Institute of Ion Beam Physics and Materials Research, Technische Universität Dresden
K. Asano ChemE/Materials for Energy Conversion and Storage - AS , National Institute of Advanced Industrial Science and Technology (AIST)
R. Heller Institute of Ion Beam Physics and Materials Research
H. Reuther Institute of Ion Beam Physics and Materials Research
J. Grenzer Institute of Ion Beam Physics and Materials Research
H. Schreuders ChemE/Afdelingsbureau
B. Dam ChemE/Materials for Energy Conversion and Storage - AS
K. Potzger Institute of Ion Beam Physics and Materials Research
Research Group
ChemE/Materials for Energy Conversion and Storage (AS) (TU Delft)
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Published Date

31-08-2018

Language

English

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Faculty

Applied Sciences

Department

ChemE/Chemical Engineering

Research Group

ChemE/Materials for Energy Conversion and Storage

Abstract

Sputter deposited Mg2FexSi1-x films of 250 nm thickness have been investigated by means of Mössbauer spectroscopy. While non-hydrogenated films are characterized by a quadrupole split doublet, hydrogenated regions show a singlet with reduced isomer shift. The relative areas of the spectra reflect the relation between loaded and unloaded regions prepared at the same loading conditions.

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